Badania nieniszczące (Q958878): Difference between revisions
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(Changed label, description and/or aliases in en, pl, and other parts: Updating entity Badania nieniszczące with Lapacz) |
(Changed an Item: Updating statements of entity ["Badania nieniszczące" (pl)] with Lapacz) |
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Property / Version | |||
Property / Version: Emhyr var Emreis / rank | |||
Property / National Library Identifier | |||
a0000001000335 | |||
Property / National Library Identifier: a0000001000335 / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Badania niszczące / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Defekt (technika) / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Diagnostyka techniczna / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Emisja akustyczna / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Fizykochemiczne metody badawcze / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Materiałoznawstwo / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Młotek Schmidta / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Próba (technologia) / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Wytrzymałość materiałów / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Anemometria obrazowa (PIV) / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Badania prądami wirowymi (ET) / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Badania ultradźwiękowe (UT) / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Cyfrowa mikroskopia holograficzna / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Diagnostyka obrazowa techniczna / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Elipsometria / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Krystalografia rentgenowska / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Metoda Falling Weight Deflectometer (FWD) / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Metoda impulsu galwanostatycznego / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Metoda PIXE / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Mikroanaliza rentgenowska / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Mikroskopia elektronowa / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Mikroskopia optyczna / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Neutronowa analiza aktywacyjna / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Polarymetria / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Termografia impulsowa / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Wibrometria laserowa / rank | |||
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Property / Related Subject | |||
Property / Related Subject: Zaburzone korelacje kątowe (PAC) / rank | |||
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Property / Type | |||
Property / Type: Unknown / rank | |||
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Property / Version | |||
P17580T24774 | |||
Property / Version: P17580T24774 / rank | |||
Normal rank |
Latest revision as of 14:38, 5 December 2023
No description defined
- Defektoskopia
- Nieniszczące, badania
- Non-destructive testing (NDT)
- NDT
Language | Label | Description | Also known as |
---|---|---|---|
English | Badania nieniszczące |
No description defined |
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Statements
a0000001000335
0 references
P17580T24774
0 references