Spektrometria mas jonów wtórnych (Q45847): Difference between revisions
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(Changed label, description and/or aliases in en, pl, and other parts: Updating entity Spektrometria mas jonów wtórnych with Lapacz) |
(Changed an Item: Updating entity Spektrometria mas jonów wtórnych with Lapacz) |
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| Property / Version | |||
Yennefer of Vengerberg | |||
| Property / Version: Yennefer of Vengerberg / rank | |||
Normal rank | |||
Revision as of 12:30, 19 September 2023
No description defined
- FIB
- Fast Ion Bombardment
- LSIMS
- Liquid Secondary Ion Mass Spectrometry
- Metoda SIMS
- Secondary Ion Mass Spectrometry
- SIMS
- Spektrometria SIMS
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Spektrometria mas jonów wtórnych |
No description defined |
|
Statements
Yennefer of Vengerberg
0 references
Yennefer of Vengerberg
0 references